Angular X-ray Cross-Correlation Analysis Applied to the Scattering Data in 3D Reciprocal Space from a Single Crystal

We propose an application of the Angular X-ray Cross-Correlation Analysis (AXCCA) to the scattered intensity distribution measured in three-dimensional (3D) reciprocal space from a single crystalline sample. Contrary to the conventional application of AXCCA, when averaging over many two-dimensional...

Full description

Saved in:
Bibliographic Details
Published inarXiv.org
Main Authors Lapkin, Dmitry, Shabalin, Anatoly, Meijer, Janne-Mieke, Kurta, Ruslan, Sprung, Michael, Petukhov, Andrei V, Vartanyants, Ivan A
Format Paper Journal Article
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 17.02.2022
Subjects
Correlation analysis
Cross correlation
Crystal structure
Crystals
Diffraction patterns
Physics - Materials Science
Physics - Mesoscale and Nanoscale Physics
Single crystals
Online AccessGet full text

Cover

More Information
Summary:We propose an application of the Angular X-ray Cross-Correlation Analysis (AXCCA) to the scattered intensity distribution measured in three-dimensional (3D) reciprocal space from a single crystalline sample. Contrary to the conventional application of AXCCA, when averaging over many two-dimensional (2D) diffraction patterns collected from different randomly oriented samples is required, the proposed approach gives an insight into the structure of a single specimen. This is particularly useful in studies of defect-reach samples that are unlikely to have the same structure. Here, we demonstrate an example of a qualitative structure determination of a colloidal crystal on the simulated as well as experimentally measured 3D scattered intensity distributions.
ISSN:2331-8422
DOI:10.48550/arxiv.2202.08562