Exact analytical solution for electrostatic field produced by biased atomic force microscope tip dwelling above dielectric-conductor bi-layer

An exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)tip, dielectric, and conductor. The solution provides a step towards quantitative modelling of AFM-assisted electrostati...

Full description

Saved in:
Bibliographic Details
Main Authors Lyuksyutov, Sergei F, Sharipov, Ruslan A, Sigalov, Grigori, Paramonov, Pavel B
Format Journal Article
LanguageEnglish
Published 11.08.2004
Subjects
Physics - Materials Science
Physics - Soft Condensed Matter
Online AccessGet full text

Cover

More Information
Summary:An exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)tip, dielectric, and conductor. The solution provides a step towards quantitative modelling of AFM-assisted electrostatic nanolithography in polymers.
DOI:10.48550/arxiv.cond-mat/0408247