Fast recovery of ion-irradiation-induced defects in Ge2Sb2Te5 thin films at room temperature
Phase-change materials serve a broad field of applications ranging from non-volatile electronic memory to optical data storage by providing reversible, repeatable, and rapid switching between amorphous and crystalline states accompanied by large changes in the electrical and optical properties. Here...
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Main Authors | , , , , , |
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Format | Journal Article |
Language | English |
Published |
02.09.2021
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Subjects | |
Online Access | Get full text |
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Summary: | Phase-change materials serve a broad field of applications ranging from
non-volatile electronic memory to optical data storage by providing reversible,
repeatable, and rapid switching between amorphous and crystalline states
accompanied by large changes in the electrical and optical properties. Here, we
demonstrate how ion irradiation can be used to tailor disorder in initially
crystalline Ge2Sb2Te5 (GST) thin films via the intentional creation of lattice
defects. We found that continuous Ar ion irradiation at room temperature of GST
films causes complete amorphization of GST when exceeding 0.6 (for rock-salt
GST) and 3 (for hexagonal GST) displacements per atom (n_dpa). While the
transition from rock-salt to amorphous GST is caused by progressive
amorphization via the accumulation of lattice defects, several transitions
occur in hexagonal GST upon ion irradiation. In hexagonal GST, the creation of
point defects and small defect clusters leads to disordering of intrinsic
vacancy layers (van der Waals gaps) that drives the electronic metal-insulator
transition. Increasing disorder then induces a structural transition from
hexagonal to rock-salt and then leads to amorphization. Furthermore, we
observed different annealing behavior of defects for rock-salt and hexagonal
GST. The higher amorphization threshold in hexagonal GST compared to rock-salt
GST is caused by an increased defect-annealing rate, i.e., a higher resistance
against ion-beam-induced disorder. Moreover, we observed that the recovery of
defects in GST is on the time scale of seconds or less at room temperature. |
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DOI: | 10.48550/arxiv.2109.00716 |