3D-Printed Optics for Wafer-Scale Probing

Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed elements allow for efficient coupling of light to etched facets of nanophotonic waveguides. The technique is widely applicable to different integr...

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Main Authors Trappen, Mareike, Blaicher, Matthias, Dietrich, Philipp-Immanuel, Hoose, Tobias, Xu, Yilin, Billah, Muhammad Rodlin, Freude, Wolfgang, Koos, Christian
Format Journal Article
LanguageEnglish
Published 31.08.2018
Subjects
Physics - Applied Physics
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Abstract Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed elements allow for efficient coupling of light to etched facets of nanophotonic waveguides. The technique is widely applicable to different integration platforms.
AbstractList Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed elements allow for efficient coupling of light to etched facets of nanophotonic waveguides. The technique is widely applicable to different integration platforms.
Author Dietrich, Philipp-Immanuel
Koos, Christian
Xu, Yilin
Billah, Muhammad Rodlin
Hoose, Tobias
Trappen, Mareike
Blaicher, Matthias
Freude, Wolfgang
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  givenname: Yilin
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  givenname: Muhammad Rodlin
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  givenname: Wolfgang
  surname: Freude
  fullname: Freude, Wolfgang
– sequence: 8
  givenname: Christian
  surname: Koos
  fullname: Koos, Christian
BackLink https://doi.org/10.48550/arXiv.1808.10834$$DView paper in arXiv
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Snippet Mass production of photonic integrated circuits requires high-throughput wafer-level testing. We demonstrate that optical probes equipped with 3D-printed...
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Title 3D-Printed Optics for Wafer-Scale Probing
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