High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography
Resolving single atoms in large-scale volumes has been a goal for atomic resolution microscopy for a long time. Electron microscopy has come close to this goal using a combination of advanced electron optics and computational imaging algorithms. However, atomic-resolution 3D imaging in volumes large...
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Main Authors | , , , , |
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Format | Journal Article |
Language | English |
Published |
05.11.2023
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Subjects | |
Online Access | Get full text |
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Summary: | Resolving single atoms in large-scale volumes has been a goal for atomic
resolution microscopy for a long time. Electron microscopy has come close to
this goal using a combination of advanced electron optics and computational
imaging algorithms. However, atomic-resolution 3D imaging in volumes larger
than the depth of field limit of the electron optics has so far been out of
reach. Electron ptychography, a computational imaging method allowing to solve
the multiple-scattering problem from position- and momentum-resolved
measurements, provides the opportunity to surpass this limit. Here, we
experimentally demonstrate atomic resolution three-dimensional phase-contrast
imaging in a volume surpassing the depth of field limits using multi-slice
ptychographic electron tomography. We reconstruct tilt-series 4D-STEM
measurements of a Co3O4 nanocube, yielding 1.75 {\AA} resolution in a
reconstructed volume of (18.2nm)^3. |
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DOI: | 10.48550/arxiv.2311.02580 |