The possible subduction of continental material to depths greater than 200 km
Determining the depth to which continental lithosphere can be subducted into the mantle at convergent plate boundaries is of importance for understanding the long-term growth of supercontinents as well as the dynamic processes that shape such margins. Recent discoveries of coesite and diamond in reg...
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Published in | Nature (London) Vol. 407; no. 6805; pp. 734 - 736 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
London
Nature Publishing
12.10.2000
Nature Publishing Group |
Subjects | |
Online Access | Get full text |
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Summary: | Determining the depth to which continental lithosphere can be subducted
into the mantle at convergent plate boundaries is of importance for understanding
the long-term growth of supercontinents as well as the dynamic processes that
shape such margins. Recent discoveries of coesite and diamond in regional
ultrahigh-pressure (UHP) metamorphic rocks has demonstrated that continental
material can be subducted to depths of at least 120 km (ref. 1), and subduction to depths of 150-300 km
has been inferred from garnet peridotites in orogenic UHP belts based on several
indirect observations. But continental subduction
to such depths is difficult to trace directly in natural UHP metamorphic crustal
rocks by conventional mineralogical and petrological methods because of extensive
late-stage recrystallization and the lack of a suitable pressure indicator.
It has been predicted from experimental work, however, that solid-state dissolution
of pyroxene should occur in garnet at depths greater than 150 km (refs 6,7,8).
Here we report the observation of high concentrations of clinopyroxene, rutile
and apatite exsolutions in garnet within eclogites from Yangkou in the Sulu
UHP metamorphic belt, China. We interpret these data as resulting from the
high-pressure formation of pyroxene solid solutions in subducted continental
material. Appropriate conditions for the Na2O concentrations and
octahedral silicon observed in these samples are met at depths greater than
200 km. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 ObjectType-Article-1 ObjectType-Feature-2 |
ISSN: | 0028-0836 1476-4687 |
DOI: | 10.1038/35037566 |