Exploiting dynamic nonlinearity in upconversion nanoparticles for super-resolution imaging

Single-beam super-resolution microscopy, also known as superlinear microscopy, exploits the nonlinear response of fluorescent probes in confocal microscopy. The technique requires no complex purpose-built system, light field modulation, or beam shaping. Here, we present a strategy to enhance spatial...

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Published inarXiv.org
Main Authors Chen, Chaohao, Ding, Lei, Liu, Baolei, Du, Ziqin, Liu, Yongtao, Di, Xiangjun, Shan, Xuchen, Lin, Chenxiao, Zhang, Min, Xu, Xiaoxue, Zhong, Xiaolan, Wang, Jianfeng, Chang, Lingqian, Halkon, Ben J, Chen, Xin, Cheng, Faliang, Wang, Fan
Format Paper Journal Article
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 03.06.2022
Subjects
Algorithms
Finite difference method
Fluorescent indicators
Image acquisition
Image enhancement
Image resolution
Microscopy
Modulation
Nanoparticles
Nonlinear response
Nonlinearity
Physics - Optics
Spatial resolution
Upconversion
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Summary:Single-beam super-resolution microscopy, also known as superlinear microscopy, exploits the nonlinear response of fluorescent probes in confocal microscopy. The technique requires no complex purpose-built system, light field modulation, or beam shaping. Here, we present a strategy to enhance spatial resolution of superlinear microscopy by modulating excitation intensity during image acquisition. This modulation induces dynamic optical nonlinearity in upconversion nanoparticles (UCNPs), resulting in variations of higher spatial-frequency information in the obtained images. The high-order information can be extracted with a proposed weighted finite difference imaging algorithm from raw fluorescence images, to generate an image with a higher resolution than superlinear microscopy images. We apply this approach to resolve two adjacent nanoparticles within a diffraction-limited area, improving the resolution to 130 nm. This work suggests a new scope for developing dynamic nonlinear fluorescent probes in super-resolution nanoscopy.
ISSN:2331-8422
DOI:10.48550/arxiv.2206.01375