Characterization of entangling properties of quantum measurement via two-mode quantum detector tomography using coherent state probes

• Published in: arXiv.org
• Main Authors: Yokoyama, Shota, Nicola Dalla Pozza, Serikawa, Takahiro, Kuntz, Katanya B, Wheatley, Trevor A, Dong, Daoyi, Huntington, Elanor H, Yonezawa, Hidehiro
• Format: Paper Journal Article
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 09.12.2019
• Subjects: Data processing; Information technology; Nanowires; Physics - Quantum Physics; Quantum entanglement; Quantum mechanics; Quantum phenomena; Quantum theory; Sensors; Superconductors
• ISSN: 2331-8422
• DOI: 10.48550/arxiv.1705.06441

Entangled measurement is a crucial tool in quantum technology. We propose a new entanglement measure of multi-mode detection, which estimates the amount of entanglement that can be created in a measurement. To illustrate the proposed measure, we perform quantum tomography of a two-mode detector that is comprised of two superconducting nanowire single photon detectors. Our method utilizes coherent states as probe states, which can be easily prepared with accuracy. Our work shows that a separable state such as a coherent state is enough to characterize a potentially entangled detector. We investigate the entangling capability of the detector in various settings. Our proposed measure verifies that the detector makes an entangled measurement under certain conditions, and reveals the nature of the entangling properties of the detector. Since the precise characterization of a detector is essential for applications in quantum information technology, the experimental reconstruction of detector properties along with the proposed measure will be key features in future quantum information processing.