Method For Making 2-Electron Response Reduced Density Matrices Approximately N-representable
In methods like geminal-based approaches or coupled cluster that are solved using the projected Schr\"odinger equation, direct computation of the 2-electron reduced density matrix (2-RDM) is impractical and one falls back to a 2-RDM based on response theory. However, the 2-RDMs from response th...
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Published in | arXiv.org |
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Main Authors | , , , , , |
Format | Paper Journal Article |
Language | English |
Published |
Ithaca
Cornell University Library, arXiv.org
08.01.2018
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Subjects | |
Online Access | Get full text |
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Summary: | In methods like geminal-based approaches or coupled cluster that are solved using the projected Schr\"odinger equation, direct computation of the 2-electron reduced density matrix (2-RDM) is impractical and one falls back to a 2-RDM based on response theory. However, the 2-RDMs from response theory are not \(N\)-representable. That is, the response 2-RDM does not correspond to an actual physical \(N\)-electron wave function. We present a new algorithm for making these non-\(N\)-representable 2-RDMs approximately \(N\)-representable, i.e. it has the right symmetry and normalization and it fulfills the \(P\)-, \(Q\)- and \(G\)-conditions. Next to an algorithm which can be applied to any 2-RDM, we have also developed a 2-RDM optimization procedure specifically for seniority-zero 2-RDMs. We aim to find the 2-RDM with the right properties that is the closest (in the sense of the Frobenius norm) to the non-N-representable 2-RDM by minimizing the square norm of the difference between the initial 2-RDM and the targeted 2-RDM under the constraint that the trace is normalized and the 2-RDM, \(Q\)- and \(G\)-matrices are positive semidefinite, i.e. their eigenvalues are non-negative. Our method is suitable for fixing non-N-respresentable 2-RDMs which are close to being N-representable. Through the N-representability optimization algorithm we add a small correction to the initial 2-RDM such that it fulfills the most important N-representability conditions. |
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ISSN: | 2331-8422 |
DOI: | 10.48550/arxiv.1707.01022 |