Charge noise and overdrive errors in reflectometry-based charge, spin and Majorana qubit readout
Solid-state qubits incorporating quantum dots can be read out by gate reflectometry. Here, we theoretically describe physical mechanisms that render such reflectometry-based readout schemes imperfect. We discuss charge qubits, singlet-triplet spin qubits, and Majorana qubits. In our model, we accoun...
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Published in | arXiv.org |
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Main Authors | , , |
Format | Paper Journal Article |
Language | English |
Published |
Ithaca
Cornell University Library, arXiv.org
22.06.2020
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Subjects | |
Online Access | Get full text |
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Summary: | Solid-state qubits incorporating quantum dots can be read out by gate reflectometry. Here, we theoretically describe physical mechanisms that render such reflectometry-based readout schemes imperfect. We discuss charge qubits, singlet-triplet spin qubits, and Majorana qubits. In our model, we account for readout errors due to slow charge noise, and due to overdriving, when a too strong probe is causing errors. A key result is that for charge and spin qubits, the readout fidelity saturates at large probe strengths, whereas for Majorana qubits, there is an optimal probe strength which provides a maximized readout fidelity. We also point out the existence of severe readout errors appearing in a resonance-like fashion as the pulse strength is increased, and show that these errors are related to probe-induced multi-photon transitions. Besides providing practical guidelines toward optimized readout, our study might also inspire ways to use gate reflectometry for device characterization. |
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ISSN: | 2331-8422 |
DOI: | 10.48550/arxiv.2006.12391 |