Rapid Co-optimization of Processing and Circuit Design to Overcome Carbon Nanotube Variations

• Published in: arXiv.org
• Main Authors: Hills, Gage, Zhang, Jie, Shulaker, Max Marcel, Wei, Hai, Chi-Shuen, Lee, Balasingam, Arjun, H -S Philip Wong, Mitra, Subhasish
• Format: Paper Journal Article
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 20.07.2015
• Subjects: Carbon; Carbon nanotubes; Circuit design; Computer Science - Emerging Technologies; Design optimization; Design parameters; Digital systems; Energy costs; Exploration; Field effect transistors; Nanotubes; Noise; Parameter identification; Process parameters; Semiconductor devices
• ISSN: 2331-8422
• DOI: 10.48550/arxiv.1507.05679

Carbon nanotube field-effect transistors (CNFETs) are promising candidates for building energy-efficient digital systems at highly-scaled technology nodes. However, carbon nanotubes (CNTs) are inherently subject to variations that reduce circuit yield, increase susceptibility to noise, and severely degrade their anticipated energy and speed benefits. Joint exploration and optimization of CNT processing options and CNFET circuit design are required to overcome this outstanding challenge. Unfortunately, existing approaches for such exploration and optimization are computationally expensive, and mostly rely on trial-and-error-based ad hoc techniques. In this paper, we present a framework that quickly evaluates the impact of CNT variations on circuit delay and noise margin, and systematically explores the large space of CNT processing options to derive optimized CNT processing and CNFET circuit design guidelines. We demonstrate that our framework: 1) runs over 100x faster than existing approaches, and 2) accurately identifies the most important CNT processing parameters, together with CNFET circuit design parameters (e.g., for CNFET sizing and standard cell layouts), to minimize the impact of CNT variations on CNFET circuit speed with less than 5% energy cost, while simultaneously meeting circuit-level noise margin and yield constraints.