Interferometer-controlled soft X-ray scanning photoemission microscope at SOLEIL

• Published in: arXiv.org
• Main Authors: Avila, José, Ivy Razado-Colambo, Lorcy, Stephane, Giorgetta, Jean-Luc, Polack, François, Asensio, María C
• Format: Paper Journal Article
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 28.12.2012
• Subjects: Automatic control; Feedback; Fresnel zones; Interferometry; Light elements; Photoelectric emission; Photoelectrons; Physics - Instrumentation and Detectors; Physics - Materials Science; Physics - Mesoscale and Nanoscale Physics; Position measurement; Soft x rays; X ray absorption; Zone plates
• ISSN: 2331-8422
• DOI: 10.48550/arxiv.1212.6443

ANTARES beamline (BL), a new soft X-ray scanning photoemission microscope located at the SOLEIL synchrotron storage ring has been recently designed, built and commissioned. The implemented interferometer control allows the accurate measurement of the transverse position of the Fresnel zone plate (FZP) relative to the sample. An effective sample position feedback has been achieved during experiments in static mode, with a fixed FZP position required to perform nano Angle-Resolved Photoelectron Spectroscopy (Nano-ARPES) measurements. Likewise, long-term stability has been attained for the FZP position relative to the sample during the translation of the FZP when performing typical X-ray absorption experiments around the absorption edges of light elements. Moreover, a fully automatic feedback digital control of the interferometric system provides extremely low orthogonal distortion of the recorded two-dimensional images. The microscope is diffraction limited with the resolution set to several tens of nanometers by the quality of the zone plates. Details on the design of the interferometric system and a brief description of the first commissioning results are presented here.