Speciation of Nickel in a Hyperaccumulating Plant by High-Performance Liquid Chromatography−Inductively Coupled Plasma Mass Spectrometry and Electrospray MS/MS Assisted by Cloning Using Yeast Complementation
A novel analytical approach based on a combination of multidimensional hyphenated techniques and cloning of the Ni-resistance gene using yeast complementation screens was developed for the identification of nickel species in a Thlaspi caerulescens hyperaccumulating plant. The presence of an unknown...
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Published in | Analytical chemistry (Washington) Vol. 75; no. 11; pp. 2740 - 2745 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Washington, DC
American Chemical Society
01.06.2003
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Subjects | |
Online Access | Get full text |
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Summary: | A novel analytical approach based on a combination of multidimensional hyphenated techniques and cloning of the Ni-resistance gene using yeast complementation screens was developed for the identification of nickel species in a Thlaspi caerulescens hyperaccumulating plant. The presence of an unknown strong Ni complex was demonstrated by size exclusion HPLC−capillary electrophoresis with ICPMS detection. The Ni-containing peak was characterized by electrospray MS (m/z 360) and shown by collision-induced dissociation MS to be a chelate with a tricarboxylic amino acid ligand. To identify the species and demonstrate its functional character, a cDNA library was constructed from T. caerulescens, expressed in the yeast, and screened on a toxic Ni2+ medium. The extract from the surviving transformant culture gave identical HPLC−ICPMS, CZE−ICPMS, and ES MS/MS data and contained a cDNA insert homologous to the nicotianamine synthase gene. This observation allowed the identification of nicotianamine as the nickel-binding ligand. The presence of the Ni−nicotianamine complex was ultimately demonstrated by comparing tandem mass spectra of the plant and yeast extracts with those of a synthetic standard. |
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Bibliography: | istex:D55F0301A8073EF491B5D132278C450598D29EC0 ark:/67375/TPS-W62JFCW5-6 |
ISSN: | 0003-2700 1520-6882 |
DOI: | 10.1021/ac020704m |