In situ study of surface phenomena by real time phase shift interferometry

Real time phase shift interferometry is applied to the observation of a growing crystal surface. Detailed profiles of a growth hillock, such as local vibrations of slopes and height differences of growth steps, are clearly distinguished on a barium nitrate crystal, together with measurements of grow...

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Bibliographic Details
Published inJournal of crystal growth Vol. 137; no. 3; pp. 610 - 622
Main Authors Onuma, Kazuo, Kameyama, Tetsuya, Tsukamoto, Katsuo
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier B.V 01.04.1994
Elsevier
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Summary:Real time phase shift interferometry is applied to the observation of a growing crystal surface. Detailed profiles of a growth hillock, such as local vibrations of slopes and height differences of growth steps, are clearly distinguished on a barium nitrate crystal, together with measurements of growth rate at each location. It was found that the height difference of 0.92 nm was directly detectable in this interferometry, indicating that the present method is a few ten times more sensitive than conventional two-beam interferometry, applicable to in situ study, such as Michelson interferometry. It was found that: (1) Step spacing gradually increases as a step approaches the edge of a crystal, which is inferred from the non-uniformity of surface supersaturation. (2) The observation of fluctuation of the growth rate under a constant condition was analyzed as due to the unequal separation of neighboring dislocations which produce the pertubation of steps.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0022-0248
1873-5002
DOI:10.1016/0022-0248(94)91006-5