High Current Density Esaki Tunnel Diodes Based on GaSb-InAsSb Heterostructure Nanowires

We present electrical characterization of broken gap GaSb-InAsSb nanowire heterojunctions. Esaki diode characteristics with maximum reverse current of 1750 kA/cm2 at 0.50 V, maximum peak current of 67 kA/cm2 at 0.11 V, and peak-to-valley ratio (PVR) of 2.1 are obtained at room temperature. The rever...

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Published inNano letters Vol. 11; no. 10; pp. 4222 - 4226
Main Authors Ganjipour, Bahram, Dey, Anil W, Borg, B. Mattias, Ek, Martin, Pistol, Mats-Erik, Dick, Kimberly A, Wernersson, Lars-Erik, Thelander, Claes
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 12.10.2011
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Summary:We present electrical characterization of broken gap GaSb-InAsSb nanowire heterojunctions. Esaki diode characteristics with maximum reverse current of 1750 kA/cm2 at 0.50 V, maximum peak current of 67 kA/cm2 at 0.11 V, and peak-to-valley ratio (PVR) of 2.1 are obtained at room temperature. The reverse current density is comparable to that of state-of-the-art tunnel diodes based on heavily doped p-n junctions. However, the GaSb-InAsSb diodes investigated in this work do not rely on heavy doping, which permits studies of transport mechanisms in simple transistor structures processed with high-κ gate dielectrics and top-gates. Such processing results in devices with improved PVR (3.5) and stability of the electrical properties.
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ISSN:1530-6984
1530-6992
1530-6992
DOI:10.1021/nl202180b