Analysis of Order Formation in Block Copolymer Thin Films Using Resonant Soft X-ray Scattering

The lateral order of poly(styrene-block-isoprene) copolymer (PS-b-PI) thin films is characterized by the emerging technique of resonant soft X-ray scattering (RSOXS) at the carbon π* resonance and compared to ordering in bulk samples of the same materials measured using conventional small-angle X-ra...

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Bibliographic Details
Published inMacromolecules Vol. 40; no. 6; pp. 2092 - 2099
Main Authors Virgili, Justin M, Tao, Yuefei, Kortright, Jeffrey B, Balsara, Nitash P, Segalman, Rachel A
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 20.03.2007
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Summary:The lateral order of poly(styrene-block-isoprene) copolymer (PS-b-PI) thin films is characterized by the emerging technique of resonant soft X-ray scattering (RSOXS) at the carbon π* resonance and compared to ordering in bulk samples of the same materials measured using conventional small-angle X-ray scattering. We show resonance using theory and experiment that the loss of scattering intensity expected with a decrease in sample volume in the case of thin films can be overcome by tuning X-rays to the π* resonance of PS or PI. Using RSOXS, we study the microphase ordering of cylinder- and sphere-forming PS-b-PI thin films and compare these results to position space data obtained by atomic force microscopy. Our ability to examine large sample areas (∼9000 μm2) by RSOXS enables unambiguous identification of the lateral lattice structure in the thin films. In the case of the sphere-forming copolymer thin film, where the spheres are hexagonally arranged, the average sphere-to-sphere spacing is between the bulk (body-centered cubic) nearest neighbor and bulk unit cell spacings. In the case of the cylinder-forming copolymer thin film, the cylinder-to-cylinder spacing is within experimental error of that obtained in the bulk.
ISSN:0024-9297
1520-5835
DOI:10.1021/ma061734k