Structural Trends and Chemical Bonding in Te-Doped Silicon Clathrates

The recently discovered tellurium-doped silicon clathrates, Te7+ x Si20 - x and Te16Si38, both low- and high-temperature forms (cubic and rhombohedral, respectively), exhibit original structures that are all derived from the parent type I clathrate G8Si46 (G = guest atom). The similarities and diffe...

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Published inInorganic chemistry Vol. 44; no. 7; pp. 2210 - 2214
Main Authors Jaussaud, Nicolas, Pouchard, Michel, Gravereau, Pierre, Pechev, Stanislas, Goglio, Graziella, Cros, Christian, San Miguel, Alfonso, Toulemonde, Pierre
Format Journal Article
LanguageEnglish
Published United States American Chemical Society 04.04.2005
Subjects
Chemical Sciences
Material chemistry
silicon derivative
Chemical binding
Tellurium
Chemical structure
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Summary:The recently discovered tellurium-doped silicon clathrates, Te7+ x Si20 - x and Te16Si38, both low- and high-temperature forms (cubic and rhombohedral, respectively), exhibit original structures that are all derived from the parent type I clathrate G8Si46 (G = guest atom). The similarities and differences between the structures of these compounds and that of the parent one are analyzed and discussed on the basis of charge distribution and chemical bonding considerations. Because of the particular character of the Te atom, these compounds appear to be at the border between the clathrate and polytelluride families.
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ISSN:0020-1669
1520-510X
DOI:10.1021/ic040112h