Molecular Orientation in Octanedithiol and Hexadecanethiol Monolayers on GaAs and Au Measured by Infrared Spectroscopic Ellipsometry

Infrared spectroscopic ellipsometry was used for determination of molecular orientation and for lateral homogeneity studies of organic monolayers on GaAs and Au, the organic layer being either octanedithiol or hexadecanethiol (HDT). The laterally resolved measurements were performed with the infrare...

Full description

Saved in:
Bibliographic Details
Published inLangmuir Vol. 25; no. 2; pp. 919 - 923
Main Authors Rosu, Dana M, Jones, Jason C, Hsu, Julia W. P, Kavanagh, Karen L, Tsankov, Dimiter, Schade, Ulrich, Esser, Norbert, Hinrichs, Karsten
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 20.01.2009
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Infrared spectroscopic ellipsometry was used for determination of molecular orientation and for lateral homogeneity studies of organic monolayers on GaAs and Au, the organic layer being either octanedithiol or hexadecanethiol (HDT). The laterally resolved measurements were performed with the infrared mapping ellipsometer at the synchrotron storage ring BESSY II. The molecular orientation within the monolayers was determined by optical model simulations of the measured ellipsometric spectra. Different tilt angles were obtained for the monolayers of HDT and octanedithiol on GaAs: 19° and >30°, respectively. The tilt angle of the methylene chains for HDT on Au substrate (22°) is similar to the 19° tilt which was obtained for the HDT monolayers on GaAs, thus suggesting similar molecular ordering of the thiolates on both substrates.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0743-7463
1520-5827
DOI:10.1021/la8026557