Effect of Storage Time on the Retrogradation of Banana Starch Extrudate

Starch was isolated from banana starch and the retrogradation phenomenon was studied using diverse techniques, including an enzymatic measurement. Wide-angle X-ray scattering (WAXS) showed that the sample stored for 7 h presented small peaks and when the storage time increased the peaks increased in...

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Bibliographic Details
Published inJournal of agricultural and food chemistry Vol. 53; no. 4; pp. 1081 - 1086
Main Authors Bello-Pérez, L. A, Ottenhof, M.-A, Agama-Acevedo, E, Farhat, I. A
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 23.02.2005
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Summary:Starch was isolated from banana starch and the retrogradation phenomenon was studied using diverse techniques, including an enzymatic measurement. Wide-angle X-ray scattering (WAXS) showed that the sample stored for 7 h presented small peaks and when the storage time increased the peaks increased in intensity. The type of diffraction pattern found in banana extrudates is typical of the A-type crystal polymorph. The crystallinity index from the diffractograms, showed a plateau after ∼20 h of storage. The short-range order measurement with Fourier transform infrared (FTIR) spectroscopy showed that banana starch retrogradation reached a maximum value at approximately 11 h of storage, a value that agrees with the results obtained with differential scanning calorimetry (DSC), because the maximum enthalpy value (approximately 5 J/g) was calculated in the stored sample for 8 h, without changes in the stored samples for more time. Retrograded resistant starch values did not change after 12 h of storage, obtaining the maximum starch retrogradation level. FTIR, DSC, and the enzymatic technique showed the changes at the molecular level in starch during storage; in the case of WAXS, they determine the long-range order that explains the differences found in the starch retrogradation pattern measurement in banana starch. Keywords: Banana starch; retrogradation; X-ray diffraction; infrared spectroscopy; differential scanning calorimetry
Bibliography:ark:/67375/TPS-PZD8C518-G
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ISSN:0021-8561
1520-5118
DOI:10.1021/jf048858l