Thin Film Diblock Copolymers in Electric Field:  Transition from Perpendicular to Parallel Lamellae

We examine the alignment of thin film diblock copolymers subject to a perpendicular electric field. Two regimes are considered separately:  weak segregation and strong segregation. For weakly segregated blocks and below a critical value of the field, E c, surface interactions stabilize stacking of l...

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Bibliographic Details
Published inMacromolecules Vol. 35; no. 13; pp. 5161 - 5170
Main Authors Tsori, Yoav, Andelman, David
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 18.06.2002
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Summary:We examine the alignment of thin film diblock copolymers subject to a perpendicular electric field. Two regimes are considered separately:  weak segregation and strong segregation. For weakly segregated blocks and below a critical value of the field, E c, surface interactions stabilize stacking of lamellae in a direction parallel to the surfaces. Above the critical field, a first-order phase transition occurs when lamellae in a direction perpendicular to the confining surfaces (and parallel to the field) become stable. The film morphology is then a superposition of parallel and perpendicular lamellae. In contrast to Helfrich−Hurault instability for smectic liquid crystals, the mode that gets critical first has the natural lamellar periodicity. In addition, undulations of adjacent intermaterial dividing surfaces are out-of-phase with each other. For diblock copolymers in the strong segregation regime, we find two critical fields E 1 and E 2 > E 1. As the field is increased from zero above E 1, the region in the middle of the film develops an orientation perpendicular to the walls, while the surface regions still have parallel lamellae. When the field is increased above E 2, the perpendicular alignment spans the whole film. In another range of parameters, the transition from parallel to perpendicular orientation is direct.
Bibliography:istex:9DA3F2FFBF90621D719541E034C197E80E9A6C9F
ark:/67375/TPS-MB8XB2S9-8
ISSN:0024-9297
1520-5835
DOI:10.1021/ma0117716