The Importance of a Direct in Situ Evaluation of an Amphiphilic Diblock Copolymer Monolayer. The Similarity and Difference between Its Nanostructures on Water and on Solid Substrates Examined by X-ray Reflectometry and Atomic Force Microscopy

• Published in: Langmuir Vol. 15; no. 12; pp. 4295 - 4301
• Main Authors: Kago, Keitaro, Matsuoka, Hideki, Yoshitome, Ryuji, Mouri, Emiko, Yamaoka, Hitoshi
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Washington, DC American Chemical Society 08.06.1999
• Subjects: Applied sciences; Exact sciences and technology; Organic polymers; Physicochemistry of polymers; Properties and characterization; Structure, morphology and analysis; Monolayer; Atomic force microscopy; Pyridinium(vinyl) salt copolymer; Air water interface; Surface topography; Experimental study; Layer thickness; X ray reflection; Investigation method; Gas solid interface; Microroughness; Diblock copolymer; Reflectometry; Comparative study; Styrene(alpha-methyl) copolymer; Amphiphilic polymer
• ISSN: 0743-7463; 1520-5827
• DOI: 10.1021/la981220h

X-ray reflectometry (XR) was carried out on amphiphilic diblock copolymer poly(α-methylstyrene)-block-poly(decyl 4-vinylpyridine) monolayers on a water surface and on a glass plate. From XR data, the layer thickness and surface and interface roughness were determined. For comparison, atomic force microscopy (AFM) was carried out on the samples deposited on solid substrates (glass and mica). From XR data, it was quantitatively clarified that the monolayer became thicker and rougher by the deposition on solid substrates than on the water surface. AFM revealed aggregates formed on the solid substrates. The structural difference between the samples on a water surface and on solid substrates may be due to the preparation procedure of the sample on solid substrates. These findings indicate that the correct and precise information for the structure of the monolayer on water surface can be evaluated only by in situ experiments such as XR.