Lateral wave-field stacking of seismic Fresnel zones for the generalized-offset case

• Published in: Applied geophysics Vol. 12; no. 2; pp. 235 - 243
• Main Authors: Tian, Nan, Fan, Ting-En, Wang, Zong-Jun, Cai, Wen-Tao
• Format: Journal Article
• Language: English
• Published: Beijing Chinese Geophysical Society 01.06.2015; Springer Nature B.V; CNOOC Research Institute, Room 507, CNOOC Plaza B, Taiyanggongnanjie#6, Chaoyang District, Beijing 100028, China
• Subjects: Amplitudes; Bins; Diffraction; Earth and Environmental Science; Earth Sciences; Fresnel zones; Geophysics; Geophysics/Geodesy; Geotechnical Engineering & Applied Earth Sciences; Mathematical analysis; Offsets; Reflection; Seismology; Stacking; Fresnel zone; amplitude; wave theory; Offset; stacking
• ISSN: 1672-7975; 1993-0658
• DOI: 10.1007/s11770-015-0488-y

To unify different seismic geometries, the concept of generalized offset is defined and the expressions for Fresnel zones of different order on a plane are presented. Based on wave theory, the equation of the lateral wave-field stacking for generalized-offset Fresnel zones is derived. For zero and nonzero offsets, the lateral stacking amplitude of diffraction bins of different sizes is analyzed by referring to the shape of the Fresnel zones of different order. The results suggest the following. First, the contribution of diffraction bins to wave-field stacking is related to the offset, surface relief, interface dip, the depth of the shot point to the reflection interface, the observational geometry, and the size of the interference stacking region. Second, the first-order Fresnel zone is the main constructive interference, and its contribution to the reflection amplitude is slightly smaller than half the contribution of all Fresnel zones. Finally, when the size of the diffraction bin is smaller than the first-order Fresnel zone, the larger the size of the diffraction bin, the larger is the amplitude of the receiver, even in the nonzero offset-case.