Surface modification of mica due to titanium sputtering as studied by positron annihilation

• Published in: Applied radiation and isotopes Vol. 64; no. 6; pp. 651 - 655
• Main Authors: Ganguly, Bichitra, Djourelov, Nikolay, Suzuki, Takenori, Kundu, Srinanda
• Format: Journal Article
• Language: English
• Published: England Elsevier Ltd 01.06.2006
• Subjects: Mica; Positron implantation depth; Silicate sheet structure; Slow positron beam; Sputtered Ti coating; X-ray reflectivity; X-ray reflectivity; Slow positron beam; Silicate sheet structure; Positron implantation depth; Sputtered Ti coating; Mica
• ISSN: 0969-8043; 1872-9800
• DOI: 10.1016/j.apradiso.2005.12.005

Study was conducted of surface structural modification of layered sheets of mica that had been subjected to titanium (Ti) sputter coating, use being made of a variable but mono energetic slow positron beam. Comparison has been drawn with the structure of pure muscovite mica sheet. Doppler broadening (DB) of the energy of annihilation radiation has been used as a parameter to assay changes in the surface characteristics within a depth profile of 500 Å. In support of these investigations, X-ray reflectivity data was used to assay titanium film thickness and the electron density profile of the film on mica. Finally, changes involving the surface micro-morphology of the system have been corroborated by scanning electron microscopy.