An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories

• Published in: Design, Automation and Test in Europe pp. 592 - 597
• Main Authors: Gill, Balkaran, Nicolaidis, Michael, Wolff, Francis, Papachristou, Chris, Garverick, Steven
• Format: Conference Proceeding
• Language: English
• Published: Washington, DC, USA IEEE Computer Society 07.03.2005; IEEE
• Series: ACM Conferences
• Subjects: Event detection; Hardware > Hardware test; Hardware > Integrated circuits > Semiconductor memory > Static memory; Hardware > Robustness; Noise shaping; Power supplies; Random access memory; Semiconductor device noise; Semiconductor memory; Single event transient; Single event upset; Temperature sensors; Voltage
• ISBN: 9780769522883; 0769522882
• ISSN: 1530-1591; 1558-1101
• DOI: 10.1109/DATE.2005.54

In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM. The BICS is designed and validated for 100nm process technology. The BICS reliability analysis for process, voltage, temperature, and power supply noise are provided. This BICS detect various shapes of current pulses generated due to particle strike. The BICS power consumption and area overhead are also provided. This BICS found to be very reliable for process, voltage and temperature variation and under stringent noise conditions.