1s2p Resonant Inelastic X-ray Scattering of Iron Oxides

• Published in: The journal of physical chemistry. B Vol. 109; no. 44; pp. 20751 - 20762
• Main Authors: de Groot, Frank M. F, Glatzel, Pieter, Bergmann, Uwe, van Aken, Peter A, Barrea, Raul A, Klemme, Stephan, Hävecker, Michael, Knop-Gericke, Axel, Heijboer, Willem M, Weckhuysen, Bert M
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 10.11.2005
• Subjects: Electrons; Ferric Compounds - chemistry; Methods; Scattering, Radiation; Spectrum Analysis; X-Rays
• ISSN: 1520-6106; 1520-5207
• DOI: 10.1021/jp054006s

1s2p resonant inelastic X-ray scattering (RIXS) spectroscopy has been measured for a series of iron oxides, including octahedral and tetrahedral FeII and FeIII systems. Their spectral shapes have been analyzed and explained using crystal-field multiplet simulations. The RIXS planes and the K-edge and L-edge X-ray absorption spectra related to these RIXS planes will be discussed with respect to their analytical opportunities. It is concluded that the full power and possibilities of 1s2p RIXS needs an overall resolution of 0.3 eV. This will yield a technique with more detailed information than K-edge and L-edge X-ray absorption combined, obtained in a single experiment. Another major advantage is that 1s2p RIXS involves only hard X-rays, and experiments under essentially any condition and on any system are feasible.