Air-Stable, Solution-Processed Oxide p–n Heterojunction Ultraviolet Photodetector
Air-stable solution processed all-inorganic p–n heterojunction ultraviolet photodetector is fabricated with a high gain (EQE, 25 300%). Solution-processed NiO and ZnO films are used as p-type and n-type ultraviolet sensitizing materials, respectively. The high gain in the detector is due to the inte...
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Published in | ACS applied materials & interfaces Vol. 6; no. 3; pp. 1370 - 1374 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
United States
American Chemical Society
12.02.2014
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Subjects | |
Online Access | Get full text |
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Summary: | Air-stable solution processed all-inorganic p–n heterojunction ultraviolet photodetector is fabricated with a high gain (EQE, 25 300%). Solution-processed NiO and ZnO films are used as p-type and n-type ultraviolet sensitizing materials, respectively. The high gain in the detector is due to the interfacial trap-induced charge injection that occurs at the ITO/NiO interface by photogenerated holes trapped in the NiO film. The gain of the detector is controlled by the post-annealing temperature of the solution-processed NiO films, which are studied by X-ray photoelectron spectroscopy (XPS). |
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Bibliography: | SourceType-Other Sources-1 ObjectType-Article-2 content type line 63 ObjectType-Correspondence-1 |
ISSN: | 1944-8244 1944-8252 |
DOI: | 10.1021/am4050019 |