Kelvin Probe Force Microscopy Study on Conjugated Polymer/Fullerene Bulk Heterojunction Organic Solar Cells

• Published in: Nano letters Vol. 5; no. 2; pp. 269 - 274
• Main Authors: Hoppe, H, Glatzel, T, Niggemann, M, Hinsch, A, Lux-Steiner, M. Ch, Sariciftci, N. S
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 01.02.2005
• Subjects: Electric Power Supplies; Electrodes; Equipment Failure Analysis - methods; Fullerenes - analysis; Fullerenes - chemistry; Fullerenes - radiation effects; Light; Materials Testing - methods; Microscopy, Scanning Probe - methods; Nanotechnology - instrumentation; Nanotechnology - methods; Polymers - analysis; Polymers - chemistry; Polymers - radiation effects; Solar Energy; Surface Properties
• ISSN: 1530-6984; 1530-6992
• DOI: 10.1021/nl048176c

We conducted a comprehensive Kelvin probe force microscopy (KPFM) study on a classical organic solar cell system consisting of MDMO−PPV/PCBM blends. The KPFM method yields the information of topography and local work function at the nanometer scale. Experiments were performed either in the dark or under cw laser illumination at 442 nm. We identified distinct differences in the energetics on the surface of chlorobenzene and toluene cast blend films. Together with high-resolution scanning electron microscopy (SEM) experiments we were able to interpret the KPFM results and to draw some conclusions for the electron transport toward the cathode in the solar cell configuration. The results suggest that surfaces of toluene cast films exhibit a morphologically controlled hindrance for electron propagation toward the cathode, which is usually evaporated on top of the films in the solar cell device configuration.