Femtogram Detection and Quantitation of Residues Using Laser Ionization Orthogonal Time-of-Flight Mass Spectrometry

• Published in: Analytical chemistry (Washington) Vol. 81; no. 20; pp. 8623 - 8626
• Main Authors: Yu, Quan, Cao, Zhiyu, Li, Lingfeng, Yan, Bin, Hang, Wei, He, Jian, Huang, Benli
• Format: Journal Article
• Language: English
• Published: Washington, DC American Chemical Society 15.10.2009
• Subjects: Analytical chemistry; Chemical elements; Chemistry; Exact sciences and technology; Mass spectrometry; Measuring instruments; Metals; Spectrometric and optical methods; Elementary analysis; Sensitivity; Ionization; Time of flight method; Residue; Detection limit; Ultratrace compound; Metal; Mass spectrometry; Quantitative analysis
• ISSN: 0003-2700; 1520-6882
• DOI: 10.1021/ac901615k

A newly developed high irradiance laser ionization orthogonal time-of-flight mass spectrometer (LI-O-TOFMS) was employed for the elemental analysis of residues, which were prepared by evaporating mixed salt solutions. The residues were first characterized in terms of shape and elemental distribution. In TOFMS detection, all of the metal elements in the residue can be observed in the spectra. Relative sensitivity coefficients for different elements were within 1 order of magnitude, which meets semiquantitative analysis criteria. By calculating the individual masses from the ablated area due to a single laser shot, the absolute detection limit reached 7 × 10−15 g for most metal elements. The results indicate that LI-O-TOFMS is capable of performing ultratrace elemental qualification and quantification, with an absolute limit of detection and an absolute limit of quantitation at the femtogram level.