Secondary Fluorescence Enhancement in Confocal X-ray Microscopy Analysis

In the present work, the influence of the secondary fluorescence enhancement in confocal X-ray microscopy analysis is studied when stratified type of materials are examined. Through a proper mathematical formalism, an exact global theoretical model is presented which accounts for the secondary fluor...

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Bibliographic Details
Published inAnalytical chemistry (Washington) Vol. 81; no. 12; pp. 4946 - 4954
Main Authors Sokaras, Dimosthenis, Karydas, Andreas-Germanos
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 15.06.2009
Subjects
Analytical chemistry
Chemistry
Exact sciences and technology
Fluorescence
Microscopy
Spectrometric and optical methods
X-rays
Stratified material
Theoretical model
Confocal microscopy
X ray fluorescence spectrometry
X ray analysis
X ray emission
Fluorescence spectrometry
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Summary:In the present work, the influence of the secondary fluorescence enhancement in confocal X-ray microscopy analysis is studied when stratified type of materials are examined. Through a proper mathematical formalism, an exact global theoretical model is presented which accounts for the secondary fluorescence enhancement when either particle (3D-Micro particle induced X-ray emission) or photon (3D-Micro X-ray fluorescence) microbeams are used in the excitation channel. The contribution of the secondary fluorescence effect to the confocal X-ray intensity profiles was calculated for some typical representative cases. In addition, the influence of several experimental parameters was examined in terms of their influence in the absolute intensity and shape of the secondary fluorescence intensity profile.
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ISSN:0003-2700
1520-6882
DOI:10.1021/ac900688n