Annealing-Induced Molecular Reorientation in Oligosilane Thin Films

Annealing effects on molecular orientation and multilayer order in vacuum-deposited permethyldecasilane thin films were investigated by means of X-ray diffractometry (XRD) and UV absorption spectroscopy. An annealing-induced multilayered structure with the molecular orientation oblique to the substr...

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Bibliographic Details
Published inThe journal of physical chemistry. B Vol. 105; no. 19; pp. 4118 - 4121
Main Authors Ichino, Yoshiro, Minami, Nobutsugu
Format Journal Article
LanguageEnglish
Published American Chemical Society 17.05.2001
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