Effects of Layer Thickness and Annealing of PEDOT:PSS Layers in Organic Photodetectors

We have investigated the effects of thickness variation and thermal treatment of the electrode polymer poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) in photovoltaic and photodetector devices using conjugated polymer blends as the photoactive material. By variation of the PE...

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Bibliographic Details
Published inMacromolecules Vol. 42; no. 17; pp. 6741 - 6747
Main Authors Friedel, Bettina, Keivanidis, Panagiotis E, Brenner, Thomas J. K, Abrusci, Agnese, McNeill, Christopher R, Friend, Richard H, Greenham, Neil C
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 08.09.2009
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Summary:We have investigated the effects of thickness variation and thermal treatment of the electrode polymer poly(3,4-ethylenedioxythiophene):poly(styrenesulfonic acid) (PEDOT:PSS) in photovoltaic and photodetector devices using conjugated polymer blends as the photoactive material. By variation of the PEDOT:PSS layer thickness between 25 and 150 nm, we found optimum device performance, in particular low dark current and high external quantum efficiency (EQE) and open-circuit voltage (V oc), at around 70 nm. This has been observed for two different active layers. Annealing studies on the PEDOT:PSS films, with temperatures varied between 120 and 400 °C, showed an optimum device performance, in particular EQE and V oc at 250 °C. This optimum performance was found to be associated with loss of water from the PSS shell of the PEDOT:PSS grains. For annealing temperatures above 260 °C, device performance was dramatically reduced. This was associated with chemical decomposition leading to loss of sulfonic acid, although this did not significantly affect the in-plane conductivity.
ISSN:0024-9297
1520-5835
DOI:10.1021/ma901182u