Modification of Monomolecular Self-Assembled Films by Nitrogen−Oxygen Plasma
The modification of octadecanethiolate self-assembled monolayers on Au and Ag by nitrogen−oxygen downstream microwave plasma with variable oxygen content (up to 1%) has been studied by synchrotron-based high-resolution X-ray photoelectron spectroscopy. The primary processes were dehydrogenation, des...
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Published in | The journal of physical chemistry. B Vol. 110; no. 25; pp. 12523 - 12529 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
American Chemical Society
29.06.2006
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Online Access | Get full text |
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Summary: | The modification of octadecanethiolate self-assembled monolayers on Au and Ag by nitrogen−oxygen downstream microwave plasma with variable oxygen content (up to 1%) has been studied by synchrotron-based high-resolution X-ray photoelectron spectroscopy. The primary processes were dehydrogenation, desorption of hydrocarbon and sulfur-containing species, and the oxidation of the alkyl matrix and headgroup−substrate interface. The exact character and the rates of the plasma-induced changes were found to be dependent on the substrate and plasma composition, with the processes in the aliphatic matrix and headgroup−substrate interface being mostly decoupled. In particular, the rates of all major plasma-induced processes were found to be directly proportional to the oxygen content in the plasma, which can be, thus, considered as a measure of the plasma reactivity. Along with the character of the observed changes, exhibiting a clear dominance of the oxidative processes, this suggests that the major effect of the oxygen−nitrogen downstream microwave plasma is provided by reactive oxygen-derived species in the downstream region, viz. long-living oxygen radicals and metastable species. |
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Bibliography: | istex:DE653EA904E308C4985C463F3816B268C2A220D7 ark:/67375/TPS-HD6XPB1B-J ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1520-6106 1520-5207 |
DOI: | 10.1021/jp060572r |