Atomic force microscopy in process engineering introduction to AFM for improved processes and products

• Main Authors: Bowen, W. Richard, Hilal, Nidal
• Format: eBook Book
• Language: English
• Published: Burlington, MA Butterworth-Heinemann 2009; Oxford Elsevier; Elsevier/Butterworth-Heinemann; Elsevier Science & Technology
• Edition: 1
• Series: Butterworth-Heinemann/IChemE series
• Subjects: Atomic force microscopy; Chemistry & Chemical Engineering; General References; Production engineering

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practicing engineers as well as to those who are improving their AFM skills and knowledge, and researchers who are developing new...

Table of Contents:

• Title Page Preface Table of Contents 1. Basic Principles of Atomic Force Microscopy 2. Measurement of Particle and Surface Interactions Using Force Microscopy 3. Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy 4. Investigating Membranes and Membrane Processes with Atomic Force Microscopy 5. AFM and Development of (Bio)Fouling-Resistant Membranes 6. Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy 7. Micro/Nanoengineering and AFM for Cellular Sensing 8. Atomic Force Microscopy and Polymers on Surfaces 9. Application of Atomic Force Microscopy for the Study of Tensile and Microrheological Properties of Fluids 10. Future Prospects Index
• Index -- A -- B -- C -- D -- E -- F -- G -- H -- I -- J -- L -- M -- N -- O -- P -- Q -- R -- S -- T -- U -- V -- W -- Y -- Z
• 4.8 Characterisation of Metal Surfaces -- 4.9 Conclusions -- Acknowledgements -- List of Abbreviations -- Chapter 5 AFM and Development of (Bio)Fouling-Resistant Membranes -- 5.1 Introduction -- 5.2 Measurement of Adhesion of Colloidal Particles and Cells to Membrane Surfaces -- 5.3 Modification of Membranes -- 5.4 Modification of Membranes with Sulphonated Poly(Ether-Ether Ketone) Polymers -- 5.5 Conclusions -- Acknowledgements -- Abbreviations and Symbols -- Chapter 6 Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy -- 6.1 Introduction -- 6.2 The AFM as a Force Measurement Tool in Pharmaceuticals -- 6.3 AFM Imaging-Based Studies -- 6.4 Micro- and Nanothermal Characterisation with SPM -- 6.5 Conclusions -- Acknowledgements -- Abbreviations and Symbols -- Chapter 7 Micro/Nanoengineering and AFM for Cellular Sensing -- 7.1 Introduction -- 7.2 Engineering the ECM for Probing Cell Sensing -- 7.3 AFM in Cell Measurement -- 7.4 Conclusions -- Acknowledgements -- Abbreviations and Symbols -- Chapter 8 Atomic Force Microscopy and Polymers on Surfaces -- 8.1 Introduction -- 8.2 Basic Concepts -- 8.3 End-grafted Polymer Chains -- 8.4 Diblock Copolymers Adsorbed on Surfaces -- 8.5 Star-shaped Polymers Adsorbed on Surfaces -- 8.6 Conclusions -- Acknowledgements -- List of Abbreviations -- List of Symbols -- Chapter 9 Application of Atomic Force Microscopy for the Study of Tensile and Microrheological Properties of Fluids -- 9.1 Introduction -- 9.2 Dynamic AFM Methods for the Characterisation of Material Properties -- 9.3 Dynamic Modulation Studies on Confined Fluids -- 9.4 Determination of Rheological Properties from Resonance Spectra -- 9.5 Cavitation and Adhesive Failure of Thin Films -- 9.6 Mesoscale Experimental Studies of the Tensile Behaviour of Thin Fluid Films -- Acknowledgements -- List of Symbols -- Chapter 10 Future Prospects
• Front Cover -- Atomic Force Microscopy in Process Engineering: Introduction to AFM for Improved Processes and Products -- Copyright Page -- Contents -- Preface -- About the Editors -- List of Contributors -- Chapter 1 Basic Principles of Atomic Force Microscopy -- 1.1 Introduction -- 1.2 The Atomic Force Microscope -- 1.3 Cantilevers and Probes -- 1.4 Imaging Modes -- 1.5 The AFM as a Force Sensor -- 1.6 Calibration of AFM Microcantilevers -- 1.7 Colloid Probes -- Abbreviations and Symbols -- Chapter 2 Measurement of Particle and Surface Interactions Using Force Microscopy -- 2.1 Introduction -- 2.2 Colloid Probes -- 2.3 Interaction Forces -- 2.4 Adhesion Forces Measured by AFM -- 2.5 Effect of Roughness on Measured Adhesion and Surface Forces -- Abbreviations and Symbols -- Greek Symbols -- Chapter 3 Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy -- 3.1 Introduction -- 3.2 Particle-Bubble Interactions -- 3.3 Determination of Particle-Bubble Separation -- 3.4 Determination of Contact Angle from Force-Distance Curves -- 3.5 Effect of Surface Preparation on Particle-Bubble Interactions -- 3.6 Effect of Loading Force on Particle-Bubble Interactions -- 3.7 Effect of Hydrodynamics on Particle-Bubble Interactions -- 3.8 Conclusions -- List of Abbreviations -- List of Symbols -- Chapter 4 Investigating Membranes and Membrane Processes with Atomic Force Microscopy -- 4.1 Introduction -- 4.2 The Range of Possibilities for Investigating Membranes -- 4.3 Correspondence between Surface Pore Dimensions from AFM and MWCO -- 4.4 Imaging in Liquid and the Determination of Surface Electrical Properties -- 4.5 Effects of Surface Roughness on Interactions with Particles -- 4.6 'Visualisation' of the Rejection of a Colloid by a Membrane Pore and Critical Flux -- 4.7 The Use of AFM in Membrane Development