Atomic force microscopy in process engineering introduction to AFM for improved processes and products

This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practicing engineers as well as to those who are improving their AFM skills and knowledge, and researchers who are developing new...

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Bibliographic Details
Main Authors Bowen, W. Richard, Hilal, Nidal
Format eBook Book
LanguageEnglish
Published Burlington, MA Butterworth-Heinemann 2009
Oxford Elsevier
Elsevier/Butterworth-Heinemann
Elsevier Science & Technology
Edition1
SeriesButterworth-Heinemann/IChemE series
Subjects
Atomic force microscopy
Chemistry & Chemical Engineering
General References
Production engineering
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Summary:This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practicing engineers as well as to those who are improving their AFM skills and knowledge, and researchers who are developing new products and solutions using AFM. The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: Particle-particle and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
Bibliography:1856175170
9781856175173
Includes bibliographical references and index
ISBN:1856175170
9781856175173