Near-Field Plasmonic Probe with Super Resolution and High Throughput and Signal-to-Noise Ratio
Near-field scanning optical microscopy (NSOM) enables observation of light-matter interaction with a spatial resolution far below the diffraction limit without the need for a vacuum environment. However, modern NSOM techniques remain subject to a few fundamental restrictions. For example, concerning...
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Published in | Nano letters Vol. 18; no. 2; pp. 881 - 885 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
United States
American Chemical Society
14.02.2018
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Subjects | |
Online Access | Get full text |
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Summary: | Near-field scanning optical microscopy (NSOM) enables observation of light-matter interaction with a spatial resolution far below the diffraction limit without the need for a vacuum environment. However, modern NSOM techniques remain subject to a few fundamental restrictions. For example, concerning the aperture tip (a-tip), the throughput is extremely low, and the lateral resolution is poor; both are limited by the aperture size. Meanwhile, with regard to the scattering tip (s-tip), the signal-to-noise ratio (SNR) appears to be almost zero; consequently, one cannot directly use the measured data. In this work, we present a plasmonic tip (p-tip) developed by tailoring subwavelength annuli so as to couple internal radial illumination to surface plasmon polaritons (SPPs), resulting in an ultrastrong, superfocused spot. Our p-tip supports both a radial symmetric SPP excitation and a Fabry–Pérot resonance, and experimental results indicate an optical resolution of 10 nm, a topographic resolution of 10 nm, a throughput of 3.28%, and an outstanding SNR of up to 18.2 (nearly free of background). The demonstrated p-tip outperforms state-of-the-art NSOM tips and can be readily employed in near-field optics, nanolithography, tip-enhanced Raman spectroscopy, and other applications. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1530-6984 1530-6992 1530-6992 |
DOI: | 10.1021/acs.nanolett.7b04142 |