Influence of Asymmetric Contact Form on Contact Resistance and Schottky Barrier, and Corresponding Applications of Diode

• Published in: ACS applied materials & interfaces Vol. 9; no. 22; pp. 18945 - 18955
• Main Authors: Zhao, Yudan, Xiao, Xiaoyang, Huo, Yujia, Wang, Yingcheng, Zhang, Tianfu, Jiang, Kaili, Wang, Jiaping, Fan, Shoushan, Li, Qunqing
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 07.06.2017
• Subjects: contact form; diode; carbon nanotube; MoS2; Schottky barrier
• ISSN: 1944-8244; 1944-8252
• DOI: 10.1021/acsami.7b04076

We have fabricated carbon nanotube and MoS2 field-effect transistors with asymmetric contact forms of source–drain electrodes, from which we found the current directionality of the devices and different contact resistances under the two current directions. By designing various structures, we can conclude that the asymmetric electrical performance was caused by the difference in the effective Schottky barrier height (ΦSB) caused by the different contact forms. A detailed temperature-dependent study was used to extract and compare the ΦSB for both contact forms of CNT and MoS2 devices; we found that the ΦSB for the metal-on-semiconductor form was much lower than that of the semiconductor-on-metal form and is suitable for all p-type, n-type, or ambipolar semiconductors. This conclusion is meaningful with respect to the design and application of nanomaterial electronic devices. Additionally, using the difference in barrier height caused by the contact forms, we have also proposed and fabricated Schottky barrier diodes with a current ratio up to 104; rectifying circuits consisting of these diodes were able to work in a wide frequency range. This design avoided the use of complex chemical doping or heterojunction methods to achieve fundamental diodes that are relatively simple and use only a single material; these may be suitable for future application in nanoelectronic radio frequency or integrated circuits.