Imaging of Photonic Crystal Localized Modes through Third-Harmonic Generation

We demonstrate high-spatial resolution imaging of localized cavity modes through third-harmonic frequency conversion. The experiments are performed with a III-nitride-on-silicon photonic platform. The resonant cavities are formed within suspended two-dimensional photonic crystals and are excited wit...

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Bibliographic Details
Published inACS photonics Vol. 3; no. 7; pp. 1240 - 1247
Main Authors Zeng, Yijia, Roland, Iannis, Checoury, Xavier, Han, Zheng, El Kurdi, Moustafa, Sauvage, Sébastien, Gayral, Bruno, Brimont, Christelle, Guillet, Thierry, Semond, Fabrice, Boucaud, Philippe
Format Journal Article
LanguageEnglish
Published American Chemical Society 20.07.2016
Subjects
Condensed Matter
Other
Physics
photonic crystal
subwavelength imaging
III-nitride semiconductors
third-harmonic generation
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Summary:We demonstrate high-spatial resolution imaging of localized cavity modes through third-harmonic frequency conversion. The experiments are performed with a III-nitride-on-silicon photonic platform. The resonant cavities are formed within suspended two-dimensional photonic crystals and are excited with a continuous-wave excitation around 1550 nm. The III-nitride materials (GaN and AlN) are transparent for both pump and harmonics. The third-harmonic nonlinear process allows one to indirectly observe the fundamental confined cavity mode with spatial profiles equivalent to those usually obtained by local probe microscopy techniques such as scanning near-field optical microscopy. An excellent agreement is obtained between the measured polarization-resolved third-harmonic emission patterns and those calculated through the third-order nonlinear polarization. We show that the spatial profiles of the radiated patterns are strongly dependent on defocusing, thus highlighting the strong sensitivity of the imaging.
ISSN:2330-4022
2330-4022
DOI:10.1021/acsphotonics.6b00236