Correlation of Nanowear Patterns to Viscoelastic Response in a Thin Polystyrene Melt
The response of a thin-film polystyrene melt to a raster-scanned scanning force microscope tip was investigated. At high temperatures the scanning process induced intricate pattern formation whose quantitative characteristics were compared at different temperatures and scan rates. The dependence of...
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Published in | Langmuir Vol. 15; no. 2; pp. 317 - 321 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Washington, DC
American Chemical Society
19.01.1999
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Subjects | |
Online Access | Get full text |
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Summary: | The response of a thin-film polystyrene melt to a raster-scanned scanning force microscope tip was investigated. At high temperatures the scanning process induced intricate pattern formation whose quantitative characteristics were compared at different temperatures and scan rates. The dependence of the patterns on temperature and scan rate was consistent with time−temperature superposition as described by the Williams−Landel−Ferry (WLF) equation. WLF analysis implies an increased glass transition temperature derived from elevated pressure beneath the tip. The latter provides an estimate of the radius of the affected film region near the tip. |
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Bibliography: | istex:E3B3EC5E16637C24463AC966E8A401EA50F2EDB4 ark:/67375/TPS-NBW7WTV7-5 |
ISSN: | 0743-7463 1520-5827 |
DOI: | 10.1021/la980739a |