Surface Relaxations in Polymers

Near-edge X-ray absorption fine structure, NEXAFS, spectroscopy was used to investigate the relaxations of polystyrene, a typical amorphous polymer, near a free surface after the imposition of a small deformation. Using synchrotron radiation, the NEXAFS dichroic ratio was determined for both the Aug...

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Bibliographic Details
Published inMacromolecules Vol. 30; no. 25; pp. 7768 - 7771
Main Authors Liu, Y, Russell, T. P, Samant, M. G, Stöhr, J, Brown, H. R, Cossy-Favre, A, Diaz, J
Format Journal Article
LanguageEnglish
Published Washington, DC American Chemical Society 15.12.1997
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Summary:Near-edge X-ray absorption fine structure, NEXAFS, spectroscopy was used to investigate the relaxations of polystyrene, a typical amorphous polymer, near a free surface after the imposition of a small deformation. Using synchrotron radiation, the NEXAFS dichroic ratio was determined for both the Auger and total electron yield processes as a function of temperature to determine the orientation of the polymer in the first 1 and 10 nm from the free surface, respectively. Complete relaxation of the polymer was not seen for temperatures less than the bulk glass transition temperature. No evidence of enhanced mobility at the free surface was found. A planar relaxation of the polymer was found in the first nanometer from the free surface, whereas in the first 10 nm, the dominant relaxation was normal to the surface.
Bibliography:ark:/67375/TPS-6TVM36HC-R
Abstract published in Advance ACS Abstracts, November 15, 1997.
istex:25DF00A24E95FD03C654FF51539BCD03E29EB747
ISSN:0024-9297
1520-5835
DOI:10.1021/ma970869a