Micro-scale structural and chemical characterisation of deformed rocks with simultaneous in-situ synchrotron X-ray fluorescence and backscatter diffraction mapping

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Bibliographic Details
Published inChemical geology Vol. 645; p. 121886
Main Authors Schrank, C.E., Jones, M.W.M., Howard, D.L., Berger, A., Herwegh, M.
Format Journal Article
LanguageEnglish
Published 05.02.2024
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ISSN:0009-2541
DOI:10.1016/j.chemgeo.2023.121886