Fault-Trajectory Approach for Fault Diagnosis on Analog Circuits

This issue discusses the fault-trajectory approach suitability for fault diagnosis on analog networks. Recent works have shown promising results concerning a method based on this concept for ATPG for diagnosing faults on analog networks. Such method relies on evolutionary techniques, where a generic...

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Bibliographic Details
Published inDesign, Automation and Test in Europe pp. 174 - 175
Main Authors Savioli, Carlos Eduardo, Czendrodi, Claudio C., Calvano, Jose Vicente, Filho, Antonio Carneiro de Mesquita
Format Conference Proceeding
LanguageEnglish
Published Washington, DC, USA IEEE Computer Society 07.03.2005
IEEE
SeriesACM Conferences
Subjects
Analog circuits
Automatic test pattern generation
Circuit faults
Circuit testing
Computing methodologies > Artificial intelligence > Search methodologies > Heuristic function construction
Design for testability
Electronic equipment testing
Electronics industry
Fabrication
Fault diagnosis
Frequency
Hardware > Emerging technologies
Hardware > Hardware test
Hardware > Robustness
Hardware > Very large scale integration design
Theory of computation > Design and analysis of algorithms > Data structures design and analysis > Sorting and searching
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Summary:This issue discusses the fault-trajectory approach suitability for fault diagnosis on analog networks. Recent works have shown promising results concerning a method based on this concept for ATPG for diagnosing faults on analog networks. Such method relies on evolutionary techniques, where a generic algorithm (GA) is coded to generate a set of optimum frequencies capable to disclose faults.
Bibliography:SourceType-Conference Papers & Proceedings-1
ObjectType-Conference Paper-1
content type line 25
ISBN:9780769522883
0769522882
ISSN:1530-1591
1558-1101
DOI:10.1109/DATE.2005.154