Effect of Structure and Size on the Electrical Properties of Nanocrystalline WO3 Films

• Published in: ACS applied materials & interfaces Vol. 2; no. 9; pp. 2623 - 2628
• Main Authors: Vemuri, R.S, Bharathi, K. Kamala, Gullapalli, S.K, Ramana, C.V
• Format: Journal Article
• Language: English
• Published: United States American Chemical Society 01.09.2010
• Subjects: Electric Conductivity; Materials Testing; Membranes, Artificial; Nanostructures - chemistry; Nanostructures - ultrastructure; Oxides - chemistry; Particle Size; Tungsten - chemistry; H2S sensors; WO3 thin films; variable range hopping; size effects; small polaron hopping; electrical properties

Nanocrystalline WO3 films were grown by reactive magnetron sputter-deposition by varying the substrate temperature in the range of 303(RT)−673 K. The structure and electrical transport properties of WO3 films were evaluated using X-ray diffraction and dc electrical conductivity measurements. The eff...