Structural Study of the Annealing of Alkylsiloxane Self-Assembled Monolayers on Silicon by High-Resolution X-ray Diffraction

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Bibliographic Details
Published inJournal of physical chemistry (1952) Vol. 99; no. 38; pp. 14039 - 14051
Main Authors Murphy, M. A, Nordgren, C. E, Fischetti, R. F, Blasie, J. K, Peticolas, L. J, Bean, J. C
Format Journal Article
LanguageEnglish
Published American Chemical Society 01.09.1995
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Bibliography:istex:D372ABA8F97C938998C239464D22D0CCC575A7DD
ark:/67375/TPS-ZSM78QX3-T
ISSN:0022-3654
1541-5740
DOI:10.1021/j100038a040