Efficient High Area OFETs by Solution Based Processing of a π-Electron Rich Donor
We report on the preparation of high performance field-effect transistors (FETs) based on large areas of aligned films of a TTF derivative, namely, tetrakis-(octadecylthio)-tetrathiafulvalene (TTF-4SC18). TTF-4SC18 assembles into one-dimensional stacks in which the long alkyl chains promote intermol...
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Published in | Chemistry of materials Vol. 18; no. 20; pp. 4724 - 4729 |
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Main Authors | , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
American Chemical Society
03.10.2006
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Online Access | Get full text |
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Summary: | We report on the preparation of high performance field-effect transistors (FETs) based on large areas of aligned films of a TTF derivative, namely, tetrakis-(octadecylthio)-tetrathiafulvalene (TTF-4SC18). TTF-4SC18 assembles into one-dimensional stacks in which the long alkyl chains promote intermolecular π−π overlapping due to their extremely closely packed nature. The films were prepared from solution by zone-casting, a simple technique that does not require the use of preoriented substrates. The films were characterized by AFM and X-ray, indicating an extremely high crystalline quality. The TTF molecules are tilted with respect to the substrate surface and are well-aligned in the casting direction. More than 40 FETs were measured, showing a remarkable reproducibility of their performance. The average charge carrier mobility value measured along the casting direction was about 0.006 cm2/V s for a channel length L = 100 μm and about 0.01 cm2/V s for L = 80 μm and L = 50 μm. The FET mobilities determined in the direction perpendicular to the orientation were ca. 1 order of magnitude lower. We found that all the devices after annealing exhibited an enhanced performance with FETs mobilities about 1 order of magnitude higher. The best devices revealed a charge carrier mobility close to 0.1 cm2/V s with an on/off ratio of the order of 104. |
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Bibliography: | istex:485B40866F2021474EC20A1110AC2089B03BDF94 ark:/67375/TPS-JM64MQKT-9 |
ISSN: | 0897-4756 1520-5002 |
DOI: | 10.1021/cm060675m |