PowerNet: Transferable Dynamic IR Drop Estimation via Maximum Convolutional Neural Network

IR drop is a fundamental constraint required by almost all chip designs. However, its evaluation usually takes a long time that hinders mitigation techniques for fixing its violations. In this work, we develop a fast dynamic IR drop estimation technique, named PowerNet, based on a convolutional neur...

Full description

Saved in:
Bibliographic Details
Published inProceedings of the ASP-DAC ... Asia and South Pacific Design Automation Conference pp. 13 - 18
Main Authors Xie, Zhiyao, Ren, Haoxing, Khailany, Brucek, Sheng, Ye, Santosh, Santosh, Hu, Jiang, Chen, Yiran
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.01.2020
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:IR drop is a fundamental constraint required by almost all chip designs. However, its evaluation usually takes a long time that hinders mitigation techniques for fixing its violations. In this work, we develop a fast dynamic IR drop estimation technique, named PowerNet, based on a convolutional neural network (CNN). It can handle both vector-based and vectorless IR analyses. Moreover, the proposed CNN model is general and transferable to different designs. This is in contrast to most existing machine learning (ML) approaches, where a model is applicable only to a specific design. Experimental results show that PowerNet outperforms the latest ML method by 9% in accuracy for the challenging case of vectorless IR drop and achieves a 30× speedup compared to an accurate IR drop commercial tool. Further, a mitigation tool guided by PowerNet reduces IR drop hotspots by 26% and 31% on two industrial designs, respectively, with very limited modification on their power grids.
ISSN:2153-697X
DOI:10.1109/ASP-DAC47756.2020.9045574