Identification of Defect Sites on MgO(100) Surfaces

• Published in: Langmuir Vol. 18; no. 10; pp. 3999 - 4004
• Main Authors: Kim, Y. D, Stultz, J, Goodman, D. W
• Format: Journal Article
• Language: English
• Published: American Chemical Society 14.05.2002
• ISSN: 0743-7463; 1520-5827
• DOI: 10.1021/la0117799

Methodologies are reported that allow the identification of extended defects on MgO(100) surfaces. The techniques used include low-energy electron diffraction (LEED), metastable impact electron spectroscopy (MIES), D2O and CO temperature-programmed desorption (TPD), and MIES of adsorbed Xe. LEED and MIES data for MgO(100), TPD spectra of D2O and CO, and MIES spectra for adsorbed Xe are significantly altered as a function of the density of the extended defects. NO is shown to be an ineffective probe molecule for titration of defect sites on MgO(100).