Processing and Properties of Bulk Y–Ba–Cu–O Superconductors Fabricated by Top Seeded Melt Growth from Precursor Pellets Containing a Graded CeO2 Composition
The existence of a zone containing a low concentration of Y2BaCuO5 (Y-211) phase particles in the vicinity of the seed in single grain, bulk Y–Ba–Cu–O (YBCO) superconductors fabricated by the top seeded melt growth (TSMG) technique has been reported, suggesting the presence of low intrinsic magnetic...
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Published in | Crystal growth & design Vol. 15; no. 2; pp. 907 - 914 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
American Chemical Society
04.02.2015
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Online Access | Get full text |
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Summary: | The existence of a zone containing a low concentration of Y2BaCuO5 (Y-211) phase particles in the vicinity of the seed in single grain, bulk Y–Ba–Cu–O (YBCO) superconductors fabricated by the top seeded melt growth (TSMG) technique has been reported, suggesting the presence of low intrinsic magnetic flux pinning, and hence reduced trapped field, in this region of the sample. The possibility of introducing additional pinning centers in the vicinity of the seed in single grain YBCO, therefore, may be effective in improving the applied magnetic properties of these technologically important materials. Single grain, bulk YBCO superconductors fabricated from precursor pellets containing a graded CeO2 composition have been prepared corresponding to a secondary phase content of 2 wt % CeO2 beneath the seed and 1 wt % CeO2 at the outer, “U” shape cross-section, of the sample. The resulting graded single grain YBCO superconductors exhibit enhanced trapped field compared to standard YBCO superconductors fabricated by TSMG from precursor pellets containing purely 1 wt % CeO2. The influence of CeO2 content on the microstructure, growth process, and superconducting properties of bulk, single grain YBCO superconductors fabricated by TSMG has been investigated and used to explain the increased trapped field ability of the graded composition. |
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ISSN: | 1528-7483 1528-7505 |
DOI: | 10.1021/cg501724y |