Reliable on-chip systems in the nano-era lessons learnt and future trends

Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing reliability have emerged particularly within the last five to ten years. This perspective paper introduces the...

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Published in2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC) pp. 1 - 10
Main Authors Henkel, Jörg, Bauer, Lars, Dutt, Nikil, Gupta, Puneet, Nassif, Sani, Shafique, Muhammad, Tahoori, Mehdi, Wehn, Norbert
Format Conference Proceeding
LanguageEnglish
Published New York, NY, USA ACM 29.05.2013
IEEE
SeriesACM Conferences
Subjects
Aging
Error analysis
Hardware
Hardware > Emerging technologies
Hardware > Hardware test
Hardware > Hardware validation
Hardware > Robustness
Hardware > Very large scale integration design
Resilience
Software
Software reliability
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Summary:Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing reliability have emerged particularly within the last five to ten years. This perspective paper introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. The focus of this paper is on perspective trends from the industrial as well as academic points of view that suggest a way for coping with reliability challenges in upcoming technology nodes.
ISBN:1450320716
9781450320719
ISSN:0738-100X
DOI:10.1145/2463209.2488857