Defect tolerant probabilistic design paradigm for nanotechnologies

• Published in: Proceedings - ACM IEEE Design Automation Conference pp. 596 - 601
• Main Authors: Jacome, Margarida, He, Chen, de Veciana, Gustavo, Bijansky, Stephen
• Format: Conference Proceeding
• Language: English
• Published: New York, NY, USA ACM 07.06.2004; IEEE
• Series: ACM Conferences
• Subjects: Applied computing > Arts and humanities > Architecture (buildings) > Computer-aided design; Applied computing > Physical sciences and engineering > Engineering > Computer-aided design; Computer aided manufacturing; Costs; Design methodology; Helium; Nanoelectronics; Nanoscale devices; Scalability; Self-assembly; Silicon; Uncertainty; nanotechnologies; probabilistic design; defect tolerance
• ISBN: 1581138288; 9781581138283; 1511838288
• ISSN: 0738-100X
• DOI: 10.1145/996566.996730

Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the tremendous increase in device density of nanoelectronics will be accompanied by a substantial increase in hard and soft faults, posing a major challenge to current design methodologies and tools. In this paper we propose a novel probabilistic design paradigm for defective but reconfigurable nanofabrics. The new design goal is to devise an appropriate structural/behavioral decomposition which improves scalability by constraining the reconfiguration process, while meeting a desired probability of successful instantiation, i.e, yield. Our approach not only addresses the scalability problem in configuring dense nanofabrics subject to defects, but gives a rich framework in which critical trade-offs among performance, yield, and per chip cost can be explored. We present a concrete instance of the approach and show extensive experimental results supporting these claims.