Raman spectroscopic study of microcrystalline silica

Samples of microcrystalline silica have been examined with Raman spectroscopy to investigate the vibrational and structural characteristics of the component phases, including their spatial distribution.

Saved in:
Bibliographic Details
Published inThe American mineralogist Vol. 79; no. 3-4; pp. 269 - 273
Main Authors Kingma, Kathleen J, Hemley, Russell J
Format Journal Article
LanguageEnglish
Published Washington Mineralogical Society of America 01.04.1994
Walter de Gruyter GmbH
Subjects
Chert
framework silicates
Mineralogy
Minerals
moganite
Quartz
Raman spectra
Scientific imaging
Silica
silica minerals
silicates
spectra
X-ray diffraction data
Online AccessGet full text

Cover

More Information
Summary:Samples of microcrystalline silica have been examined with Raman spectroscopy to investigate the vibrational and structural characteristics of the component phases, including their spatial distribution.
ISSN:0003-004X
1945-3027